Method and apparatus for characterization of devices and circuits
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United States of America Patent
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Jul 31, 2007
Grant Date -
Sep 22, 2005
app pub date -
Apr 29, 2005
filing date -
Feb 12, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus for performing characterization of devices is presented. The characteristic of the device are determined by obtaining a first temperature measurement in a first location of a device, obtaining a second temperature measurement, computing the difference between the temperature measurements and, using the temperatures and/or the temperature difference, a characteristic of the device is determined.
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