Monitoring DOE performance using software scene evaluation

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United States of America Patent

PATENT NO 11054664
APP PUB NO 20160371845A1
SERIAL NO

14742816

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method for projection includes projecting a pattern of structured light with a given average intensity onto a scene. A sequence of images is captured of the scene while projecting the pattern. At least one captured image in the sequence is processed in order to extract a depth map of the scene. A condition is identified in the depth map indicative of a fault in projection of the pattern. Responsively to the identified condition, the average intensity of the projection of the pattern is reduced.

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Patent Owner(s)

  • APPLE INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Deitch, Ronen Modiin, IL 6 290
Yasovsky, Alon Rehovot, IL 5 19
Zmora, Yohai Ganey-Tikva, IL 6 10

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