Method and device for measuring the concentration of a detector gas in a measuring gas containing an interfering gas

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United States of America Patent

PATENT NO 5563330
SERIAL NO

08325226

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Abstract

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A concentration of a detector gas in a measuring gas containing an interfering gas is measured. A zero gas that is free of the detector gas and/or a test gas having a known concentration of the detector gas are supplied to an analyzer such as a non-dispersive infrared (NDIR) gas analyzer. Interfering gas is added to the measuring gas, the zero gas, and in some instances, to the test gas to an extent which allows the interfering gas to have a same concentration in each case.

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Patent Owner(s)

  • SIEMENS AKTIENGESELLSCHAFT

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kimmig, Ludwig Ettlingen, DE 4 21

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