Scatterometry target for determining CD and overlay

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7449265
SERIAL NO

11943286

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The invention can provide a method of processing a wafer using segmented multi-dimensional targets that can be used in Double-Patterning (D-P) procedures.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

  • TOKYO ELECTRON LIMITED

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dixon, David Austin, TX 62 1916

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation