Method for sensing wafers located inside a closed wafer cassette

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United States of America Patent

PATENT NO 7202491
SERIAL NO

11343476

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Wafers in a cassette are mapped without having to open the cassette. The cassette is at least partially transparent to a particular type of radiation. A source of the radiation is directed into the cassette, through a transparent or translucent part of the cassette, and an imaging sensor sensitive to the radiation detects radiation that is reflected off the wafers inside the cassette. A second source of radiation and a second camera preferably provide additional images of the wafers from a different angle. By processing these images, the spatial orientation of the wafers and loading status of the cassette can be determined.

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Patent Owner(s)

  • ASM INTERNATIONAL N.V.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Garssen, Adriaan Utrecht, NL 14 1333
Maria, de Ridder Christianus Gerardus Hoogland, NL 6 371
van, Groen Joost Utrecht, NL 2 26

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