Method and apparatus for testing adjustment of a circuit parameter
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United States of America Patent
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-
Apr 2, 2002
Issued Date -
N/A
app pub date -
Aug 22, 2000
filing date -
Sep 11, 1997
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A voltage regulator is disclosed which is coupled with a programmable trimming circuit by a trim test circuit. When disabled, the trim test circuit passes the logic states of the signals produced by the trimming circuit to the voltage regulator. When enabled, the trim test circuit applies signals to the voltage regulator which correspond with asserted logic states of signals producible by the trimming circuit. Thus, the effect of the trimming circuit on the voltage regulator is testable without actual programming of the trimming circuit.
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