X-ray microscope with switchable x-ray source

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United States of America Patent

PATENT NO 7813475
SERIAL NO

12401740

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Abstract

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An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.

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Patent Owner(s)

  • CARL ZEISS X-RAY MICROSCOPY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Feser, Michael Walnut Creek, US 35 742
Huang, Wanxia Beijing, CN 2 77
Tkachuk, Andrei Walnut Creek, US 4 173
Wang, Yuxin Northbrook, US 164 1957
Wu, Ziyu Beijing, CN 5 131
Yuan, Qingxi Beijing, CN 2 77
Yun, Wenbing Walnut Creek, US 94 3500
Zhu, Peiping Beijing, CN 3 131

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