Linearity improvements of semiconductor substrate based radio frequency devices

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United States of America Patent

PATENT NO 7868419
SERIAL NO

12254499

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention relates to using a trap-rich layer, such as a polycrystalline Silicon layer, over a semiconductor substrate to substantially immobilize a surface conduction layer at the surface of the semiconductor substrate at radio frequency (RF) frequencies. The trap-rich layer may have a high density of traps that trap carriers from the surface conduction layer. The average release time from the traps may be longer than the period of any present RF signals, thereby effectively immobilizing the surface conduction layer, which may substantially prevent capacitance and inductance changes due to the RF signals. Therefore, harmonic distortion of the RF signals may be significantly reduced or eliminated. The semiconductor substrate may be a Silicon substrate, a Gallium Arsenide substrate, or another substrate.

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Patent Owner(s)

  • QORVO US, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Carroll, Michael Jamestown, US 68 2872
Gering, Joseph M Stokesdale, US 3 453
Kerr, Daniel Charles Oak Ridge, US 55 2110
McKay, Thomas Gregory Boulder Creek, US 15 552

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