Semiconductor memory device and test method thereof
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United States of America Patent
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May 30, 2006
Issued Date -
N/A
app pub date -
May 19, 2005
filing date -
May 8, 2003
priority date (Note) -
Expired
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Abstract
A semiconductor memory device vice disclosed herein comprises: a memory cell array divided into a plurality of blocks, each of which includes a plurality of memory cells; a plurality of row decoders which correspond to the blocks, each of the row decoders including an access information holder configured to hold access information indicating whether its corresponding row decoder has been accessed; and an access information reader configured to read the access information held in the access information holders.
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