Method and apparatus for calibrating line spectrum irradiance

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United States of America Patent

PATENT NO 5034606
SERIAL NO

07482894

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and apparatus for measuring a single-wavelength irradiance employ (1) a reference photosensor unit combining a photodiode having an absolute response at a given wavelength calibrated by a self-calibration process and a precision aperture, (2) a single radiation source of the given wavelength combining a band-pass filter having a pass band only near the given wavelength and a radiation source for producing a line spectrum radiation of the given wavelength, and (3) a radiation illuminometer. The reference photosensor unit is arranged at a distance d from the single radiation source to measure the irradiance thereat, and then the radiation illuminometer is arranged at the position of the reference photosensor unit to calibrate an indicating scale of the radiation illuminometer with respect to the single radiation of the given wavelength in relation with the reference photosensor unit.

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Patent Owner(s)

  • MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohkubo, Kazuaki Takatsuki, JP 35 220
Ohno, Yoshihiro Ibaraki, JP 22 609

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