BIST scan path parts with test generator and compactor circuitry
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United States of America Patent
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Jun 29, 2010
Issued Date -
N/A
app pub date -
Mar 18, 2009
filing date -
Mar 9, 2000
priority date (Note) -
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Abstract
A Scan-BIST architecture is adapted into a low power Scan-BIST architecture. A generator 102, compactor 106, and controller 110 remain the same as in the known art. The changes between the known art Scan-BIST architecture and the low power Scan-BIST architecture involve modification of the known scan path into scan path 502, to insert scan paths A 506, B 508 and C 510, and the insertion of an adaptor circuit 504 in the control path 114 between controller 110 and scan path 502.
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