Rotating swivel unit for sensors of a coordinate measuring apparatus and method for determining corrective parameters of the rotating swivel unit
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United States of America Patent
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Feb 15, 2005
Issued Date -
N/A
app pub date -
Mar 28, 2003
filing date -
Sep 28, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to the determination of correction parameters of a rotating swivel unit. An optical sensor (9) measuring in at least one dimension is fixed to the unit. The sensor is calibrated on a calibration body in at least three rotational positions of a rotating joint of the rotating swivel unit. At least parameters of a first parameter field are calculated, the field describing the transformation (rotation) of a sensor coordinate system (u,v,w) in the machine coordinate system (X.sub.M, Y.sub.M, Z.sub.M) , and parameters of another parameter field are determined, the other field describing the shift (vector) of the sensor coordinate system in relation to the point (AB) (in the measuring arm) in the machine coordinate system.
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