Hyperthermal neutral beam source and method of operating

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United States of America Patent

PATENT NO 7638759
APP PUB NO 20080135742A1
SERIAL NO

12032865

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Method and system for pumping a hyperthermal neutral beam source is described. The pumping system enables use of the hyperthermal neutral beam source for semiconductor processing applications, such as etching processes. An embodiment is described having a neutral beam source coupled to a processing chamber through a neutralizing grid. Control is provided by separately pumping the neutral beam source and the processing chamber.

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Patent Owner(s)

  • TOKYO ELECTRON LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Lee Cedar Creek, US 195 6578
Donnelly, Vincent M Houston, US 14 919
Economou, Demetre J Houston, US 10 681

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