Method and apparatus for measuring ice thickness on substrates using backscattering of gamma rays
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United States of America Patent
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Oct 13, 1998
Issued Date -
N/A
app pub date -
Jul 29, 1997
filing date -
Aug 30, 1994
priority date (Note) -
Expired
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Abstract
The present invention provides a method and apparatus for in situ measuring thicknesses of ice buildup on airfoil. The method and device uses a probe including a high energy radioactive gamma ray source .sup.241 Am producing 60 keV photons which penetrate through the airfoil substrate and a photodetector mounted behind the source for detection of backscattered photons. The probe is mounted on the interior of the airfoil and secondary radiation is backscattered within the ice layer and back through the airfoil substrate to the photodetector. The shape and density of the source holder in addition to the geometrical arrangement of the source and detector with respect to the airfoil substrate are used to block photons backscattered in the airfoil substrate thereby favoring scattering in the ice layer over that in the aluminum.
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