Measurement of point contact Andreev-reflection characteristics of half-metallic thin films

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United States of America Patent

PATENT NO 7268563
APP PUB NO 20070046297A1
SERIAL NO

11162057

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Abstract

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An apparatus for measuring spin polarization via Point Contact Andreev Reflection (PCAR) at a magnet-superconductor junction, with variable magnetic fields and temperature control. A cryostat probe investigates superconducting energy gap and Andreev reflection in superconductor-half metal junctions, in a wide range of magnetic fields and temperature from 2K-300K. The cryostat probe is integrated with a commercial physical properties measurement system. The measurement probe includes a rotary-translation stage with coarse and fine screws that enable a user to make point contacts in a cryogenic, evacuated environment where the point contact junction can be controlled at room temperature by turning a knob. Copper wires are connected as electrical leads from an aluminum housing, descend down to a copper housing, for measurement, when contact is made by tip with a half-metal sample, such as CrO.sub.2. External current and voltage meters measure the current-voltage characteristics and data acquisition is performed using computer interface.

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Patent Owner(s)

  • UNIVERSITY OF SOUTH FLORIDA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hariharan, Srikanth Tampa, FL 21 218
Sanders, Jeff T Tampa, FL 1 5

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