Voltage probe systems having improved bandwidth capability
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United States of America Patent
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May 30, 2006
Grant Date -
Dec 4, 2003
app pub date -
May 29, 2002
filing date -
Apr 18, 2002
priority date (Note) -
Expired
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Abstract
A resistive pin for use in a voltage probe includes a pin-head that is configured to contact a test point in a device under test, and a resistor that is attached to the pin-head. Other systems are also provided for establishing electrical connections between testing instruments and devices under test.
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