Method for quantifying the manufactoring complexity of electrical designs
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United States of America Patent
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Jan 18, 2011
Grant Date -
Jul 9, 2009
app pub date -
Jan 4, 2008
filing date -
Jan 4, 2008
priority date (Note) -
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Abstract
A method and system for quantifying manufacturing complexity of electrical designs randomly places simulated defects on image data representing electrical wiring design. The number of distinct features in the image data without the simulated defects and the number of distinct features in the image data with the simulated defects are determined and the differences between the two obtained. The difference number is used as an indication of shorting potential or probability that shorts in the wiring may occur in the electrical wiring design. The simulating of the defects in the image data may be repeated and the difference value from each simulation or run may be used to obtain a statistical average or representative shorting potential or probability for the design.
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