Out-of-plane birefringence measurement
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United States of America Patent
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Dec 25, 2007
Grant Date -
Oct 6, 2005
app pub date -
Jun 16, 2005
filing date -
Dec 20, 2002
priority date (Note) -
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Abstract
The disclosure is directed to precise measurement of out-of-plane birefringence properties of samples of transparent optical material. Two angled-apart light beams are passed through a selected location of a sample optical element. One of the beams is incident to the sample surface. The characteristics of the beams are detected after passing through the sample, and the information detected is processed to determine the out-of-plane birefringence.
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