Memory cell repair using fuse programming method in a flash memory device
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United States of America Patent
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Oct 30, 2007
Grant Date -
Nov 23, 2006
app pub date -
May 19, 2005
filing date -
May 19, 2005
priority date (Note) -
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Abstract
A method for repairing cells of a flash memory array includes using a fuse memory array circuit. The fuse memory cells are initially programmed. The locations of defective memory cells of the main array are determined. These locations are stored in the fuse memory cells by erasing predetermined locations in the fuse memory cell array so that the locations are programmed.
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