Methods and apparatus for testing a component
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United States of America Patent
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Oct 14, 2008
Grant Date -
Feb 2, 2006
app pub date -
Jul 30, 2004
filing date -
Jul 30, 2004
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.
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