Test control circuit and reference voltage generating circuit having the same
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United States of America Patent
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Aug 17, 2010
Grant Date -
Jan 1, 2009
app pub date -
Dec 21, 2007
filing date -
Jun 28, 2007
priority date (Note) -
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Abstract
A test control circuit according to an embodiment of the invention includes a test mode control unit that outputs a control signal according to a voltage trimming test signal, a decoding portion that receives the control signal and outputs a decoding signal, and a trimming signal adjusting portion that receives the decoding signal and outputs a trimming signal adjusted by a low level test signal.
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