Temperature detecting semiconductor device
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United States of America Patent
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Dec 2, 2008
Grant Date -
Dec 21, 2006
app pub date -
Jun 14, 2006
filing date -
Jun 17, 2005
priority date (Note) -
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Abstract
There is provided a technique which is capable of detecting a temperature of a semiconductor device with high precision. A temperature detection circuit detecting a temperature of a semiconductor device includes a first short-cycle oscillator generating a first clock signal having positive temperature characteristics with respect to a frequency, a second short-cycle oscillator generating a second clock signal having negative temperature characteristics with respect to the frequency, and a temperature signal generation unit generating a temperature signal which is varied according to the temperature of the semiconductor device based on the first and second clock signals.
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