Double sided probing structures
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United States of America Patent
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Sep 2, 2008
Grant Date -
Mar 2, 2006
app pub date -
Sep 8, 2005
filing date -
Sep 13, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.
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