Spectrophotometer, spectroscopic measurement method, and program

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United States of America Patent

PATENT NO 11927527
APP PUB NO 20220412879A1
SERIAL NO

17841124

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Abstract

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When a measurement sample whose absorbance greatly changes depending on a wavelength range is measured, measurement with a high S/N ratio and accuracy can be efficiently performed in a short time.

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Patent Owner(s)

  • HITACHI HIGH-TECH SCIENCE CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maruyama, Kai Tokyo, JP 4 1
Wakui, Takayuki Tokyo, JP 5 4

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