Process and a circuit arrangement for evaluating a measuring capacitance
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Dec 5, 2006
Issued Date -
N/A
app pub date -
Jul 7, 2004
filing date -
Jul 22, 2003
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A process is disclosed for evaluating a measuring device comprising a capacitor (CM), with stages for charging the capacitor (CM) over an initial charging period (tk1, tk2) and for determining the capacitance charge as an initial measured value (tml). To determine a measuring condition that changes a normal state of the capacitance, e.g., moist as opposed to dry surroundings for the measuring cell, the process exhibits the following additional steps: charging the capacitance (CM) over a second charging period (tk2), which differs from the first charging period (tk1); determining the charge of the capacitance (CM) as a second measured value (tm2); and comparing the first and second measured values (tk1, tk2) to establish the comparative result.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully