Apparatus for statistical LSI delay simulation

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United States of America Patent

PATENT NO 7239997
APP PUB NO 20040167756A1
SERIAL NO

10756471

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Abstract

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A statistical delay simulation apparatus includes: a circuit simulator for simulating a circuit operation of a circuit cell constituting an LSI; a statistical delay library generator for driving the circuit simulator and generating, based on a process parameter and the like, a statistical delay library in which the dependency of a delay variation on a predetermined operation condition in each circuit cell is described; a delay calculator for calculating a delay amount of each circuit cell to generate a statistical LSI delay information file containing data on the calculated delay amount; and a static timing analyzer for simulating, based on data of the statistical LSI delay information file, an operation with a delay variation of the LSI to generate a statistical LSI delay analysis result file.

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Patent Owner(s)

  • MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yonezawa, Hirokazu Hyogo, JP 14 252

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