System, method, and apparatus for rapid development of an inspection scheme for an inspection robot

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United States of America Patent

PATENT NO 11511426
APP PUB NO 20200254615A1
SERIAL NO

16863594

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Abstract

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Systems, methods and apparatus for rapid development of an inspection scheme for an inspection robot are disclosed. An apparatus may include an inspection definition circuit to interpret an inspection description value, and a robot configuration circuit to determine an inspection robot configuration description in response to the inspection description value. The apparatus may further include a configuration implementation circuit, communicatively coupled to a configuration interface of an inspection robot, to provide at least a portion of the inspection robot configuration description to the configuration interface.

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Patent Owner(s)

Patent OwnerAddress
GECKO ROBOTICS INC100 S COMMONS SUITE 145 PITTSBURGH PA 15212

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Auda, Michael Stephen Pittsburgh, US 8 148
Bryner, Edward A Pittsburgh, US 32 764
Cho, Edwin H Pittsburgh, US 23 461
Cho, Mark Pittsburgh, US 22 313
Denner, Katherine Virginia Pittsburgh, US 11 281
Gu, Yizhu Pittsburgh, US 27 1165
Guise, Benjamin A Pittsburgh, US 8 238
Joslin, Todd Wexford, US 24 1173
Jourde, Dillon R Pittsburgh, US 27 720
Loosararian, Mark J Pittsburgh, US 7 194
Low, Kevin Y Pittsburgh, US 33 790
MacKenzie, Logan A Penn Hills, US 7 182
Miller, Ian Aspinwall, US 53 1453
Moore, Joshua D Pittsburgh, US 14 562
Mrkonich, Jeffrey J Pittsburgh, US 6 118
Pridgen, William J Pittsburgh, US 5 138
Rodriguez, Domenic P Pittsburgh, US 11 184
Trogu, Francesco H Pittsburgh, US 17 270
Watt, Alexander C North Huntingdon, US 6 63
Westenberg, Samuel Theodore Pittsburgh, US 9 159

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