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Abstract

The radiation generated by electrons from field emission current striking the anode of a high voltage vacuum device is used as an analog for the emission current in a method for assessing the dielectric state of the device. The emission current is determined by applying a variable voltage, less than that required to produce breakdown, to the device and measuring the radiation generated by the emission current. The radiation measurement is correlated to the amount of field emission current by means of a predetermined relationship, and the field enhancement factor, .beta., associated with the dielectric state of the device is determined from the slope of a plot of the logarithm of the quantity resulting from dividing the emission current by the square of the applied voltage, versus the reciprocal of the applied voltage. Alternatively, .beta. may be determined from the slope of a plot of the measured radiation versus the reciprocal voltage. A method for conditioning high voltage vacuum devices to improve the dielectric properties thereof employs one of the above methods for determining .beta. and further includes subjecting the device to a predetermined program of voltage exposure until .beta. is below a predetermined value.

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First Claim