Memory device
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United States of America Patent
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May 21, 2019
Grant Date -
Oct 26, 2017
app pub date -
Jul 10, 2017
filing date -
May 26, 2014
priority date (Note) -
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Abstract
A method of manufacturing a memory device includes: providing a substrate; forming in a cell region a channel extending in a direction perpendicular to an upper surface of the substrate and a plurality of gate electrode layers and a plurality of insulating layers stacked alternatingly on the substrate to be adjacent to the channel; forming a plurality of circuit elements on the substrate at a peripheral circuit region disposed at a periphery of the cell region; and forming an interlayer insulating layer on the substrate in the cell region and the peripheral circuit region, the interlayer insulating layer including a first, bottom interlayer insulating layer covering the plurality of circuit elements and at least a portion of the plurality of gate electrode layers, and a second, top interlayer insulating layer disposed on the first interlayer insulating layer.
First Claim
Family
- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- SAMSUNG ELECTRONICS CO., LTD.
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Jung, Won Seok | Anyang-si, KR | 8 | 49 |
Kim, Keon Soo | Suwon-si, KR | 5 | 46 |
Lee, Joon Hee | Seongnam-si, KR | 64 | 654 |
Lee, Sun Yeong | Hwaseong-si, KR | 2 | 28 |
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