Method for testing analog and mixed-signal circuits using functionally related excitations and functionally related measurements
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United States of America Patent
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Oct 31, 2006
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May 21, 2004
filing date -
May 23, 2003
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Abstract
A method for testing a circuit includes determining at least one performance characteristic of the circuit based on a functional relationship between excitation signals or on a functional relationship between measurement devices. The method is implemented either as a part of a built-in self test circuit of an integrated circuit or for production testing.
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