Lens system for a photo ion spectrometer
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United States of America Patent
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-
Nov 27, 1990
Issued Date -
N/A
app pub date -
May 4, 1987
filing date -
Jun 4, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.
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