Semiconductor device for parallel bit test and test method thereof
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United States of America Patent
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Jun 7, 2016
Grant Date -
Aug 20, 2015
app pub date -
Sep 4, 2014
filing date -
Feb 20, 2014
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Abstract
A semiconductor device includes a plurality of memory chips and a plurality of signal selection units respectively corresponding to the plurality of memory chips, and suitable for commonly transferring test data signals from an external to a corresponding one of the plurality of memory chips during a common test mode, wherein one or more of the plurality of signal selection units may transfer the test data signals from the external to corresponding ones of the plurality of memory chips during an individual test mode, and wherein the semiconductor device may be set to the common test mode when a common test signal is enabled, and set to the individual test mode when both the common test signal and a test control signal are enabled.
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