Semiconductor device and method for fabricating the same

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United States of America Patent

PATENT NO 7326990
APP PUB NO 20060220091A1
SERIAL NO

11366570

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A semiconductor device includes a first hydrogen barrier film, a capacitor device formed on the first hydrogen barrier film, and a second hydrogen barrier film formed to cover the capacitor device. The first and second hydrogen barrier films each contain at least one common type of atoms for allowing the first and second hydrogen barrier films to adhere to each other.

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Patent Owner(s)

  • MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Judai, Yuji Uji, JP 33 199
Kutsunai, Toshie Kusatsu, JP 28 274
Mikawa, Takumi Otsu, JP 131 1657

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