Optical coordinate measuring system with dual path reflecting means
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United States of America Patent
Stats
-
Mar 24, 1987
Grant Date -
N/A
app pub date -
Mar 21, 1985
filing date -
Mar 21, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An arrangement for scanning the measurement field of view of an optical measurement system, in which one or more reflecting surfaces are placed within the optical path(s) of an optical measurement system. The reflecting surface is rotated and/or translated through a control unit which controls accurately the rotating and/or translating motion. Mathematical corrections are applied to determine the true measured coordinates. The view direction of the optical measurement system is diverted by the reflecting surface mounted on a precision mechanism for scanning the view in a controlled manner.
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Cited Art Landscape
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