Semiconductor device testing method and testing equipment
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United States of America Patent
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Apr 3, 2007
Grant Date -
Mar 23, 2006
app pub date -
Mar 14, 2005
filing date -
Sep 17, 2004
priority date (Note) -
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Abstract
A burn-in testing method to perform tests with a semiconductor device operated in an atmosphere at a prescribed temperature characterized in that operation instruction signals instructing an operation of the semiconductor device are repeatedly supplied while supplying power to the semiconductor device, and increases and decreases in a power supply current corresponding to the operation instruction signals are counted.
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