Method and system for characterizing porous materials

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United States of America Patent

PATENT NO 7807213
SERIAL NO

11689937

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Abstract

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A method and system for diagnosing the effectiveness of a treatment on a porous material. For example, the porous material can include a porous low dielectric constant material. In particular, the method can utilize FTIR spectroscopy to characterize the porosity of materials, and assess the effectiveness of sealing pores in the material.

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Patent Owner(s)

  • TOKYO ELECTRON LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Toma, Dorel Ioan Dripping Springs, US 9 181
Zhu, Jianhong Austin, US 15 142

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