Circuit and method for testing a data memory
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Nov 22, 2005
Grant Date -
May 9, 2002
app pub date -
Oct 15, 2001
filing date -
Oct 13, 2000
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A data memory to be tested is connected to a processing unit. Data items to be stored are produced from a test pattern data item in the processing unit and are stored in the data memory. The data memory is tested in that the test pattern data items are received from a test device, processed using a first function to form data items to be stored, and the data items are then stored. After the stored data items are read from the memory they are processed with a second function to form test data items whose number is once more smaller than the stored data items that are read from the memory.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully