Electrical test probes with a contact element, methods of making and using the same
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United States of America Patent
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Jun 9, 2009
Grant Date -
Dec 27, 2007
app pub date -
Jan 10, 2007
filing date -
Jun 1, 2006
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Disclosed herein are electrical test probes and methods for making the same. In one embodiment, an electrical test probe comprises: a barrel, a plunger, a contact element, and a spring. The barrel comprises a contact area defined by a stop engagement and an opening at a first end of the barrel. The plunger is slidably disposed through the opening, the contact element, and the contact area. The plunger comprises a tip and a stop protrusion with a plunger extension extending therebetween. The contact element is disposed in the contact area, between the barrel and the plunger. The spring is in operational engagement with the plunger.
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