Extraction of interconnect parasitics
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United States of America Patent
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Jul 4, 2006
Issued Date -
N/A
app pub date -
Aug 18, 2004
filing date -
Aug 8, 2002
priority date (Note) -
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Abstract
The apparatus for detecting the effects of interconnect resistance and capacitance (RC) in a logic circuit includes a first ring oscillator with the interconnect RC parasitics in a logic circuit and a minimum reference ring oscillator without the interconnect RC parasitic in a logic circuit multiplexed to have common stages to obtain delay with and without the parasitics of the interconnect RC. The frequency difference between the first ring oscillator frequency and the minimum reference ring oscillator frequency is determined to detect the effects of the interconnect RC in the logic circuit.
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