Electrical test probes and methods of making the same
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United States of America Patent
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Dec 23, 2003
Grant Date -
Jun 5, 2003
app pub date -
Sep 24, 2002
filing date -
Sep 24, 2001
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.
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