System and method for measuring reflectance of object
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United States of America Patent
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Aug 2, 2011
Grant Date -
Feb 11, 2010
app pub date -
Aug 5, 2009
filing date -
Aug 7, 2008
priority date (Note) -
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status (Latency Note)
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Abstract
There are disclosed a system and a method for measuring reflectance of an object. The system for measuring reflectance of an object according to the present invention includes: a light source unit including a light source irradiating light to the object; a light source position adjusting unit that adjusts a position and a direction of the light source unit; a light receiving unit that acquires image data by detecting light reflected on the object; and a reflectance acquiring unit that acquires the reflectance of the object from the image data. According to the present invention, it is possible to more precisely acquire the reflectance of the object within a shorter time.
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