Method of aligning probe for eddy current inspection
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United States of America Patent
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Feb 2, 2010
Grant Date -
Oct 18, 2007
app pub date -
Aug 23, 2006
filing date -
Apr 12, 2006
priority date (Note) -
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Abstract
A system and method using a touch probe device for eddy current inspection. The touch probe provides a simple approach for coming within close contact of the specimen while maintaining a normal angle and pressure at the right positions. The use of the touch probe further reduces the total time for the eddy current inspection. The touch probe aligns the probe to a specimen to be inspected, for the purpose of reducing measurement errors and increasing productivity.
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