Bimetallic probe with tip end
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United States of America Patent
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Apr 6, 2010
Grant Date -
Mar 6, 2008
app pub date -
May 19, 2005
filing date -
May 31, 2004
priority date (Note) -
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status (Latency Note)
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Abstract
It is an object of the present invention to provide a probe which can provide stable electrical conduction to an electrode of an object to be measured even when it is miniaturized. A probe 100 comprises a columnar contact part 110 which can come in contact with an electrode 10 of an object to be measured almost perpendicularly, and a base end (not shown) connected to the contact part 110, the contact part 110 comprises a base part 111 and an expansion part 111a bonded to an end of the base part 111 in a width direction, and the expansion part 111a is formed of a material having a thermal expansion coefficient higher than that of the base part 111.
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