Apparatus and method for determining effect of on-chip noise on signal propagation
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United States of America Patent
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Oct 19, 2004
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app pub date -
May 22, 2003
filing date -
Oct 30, 2001
priority date (Note) -
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Abstract
The invention relates to a method for measuring the effects of on-chin noise on signal propagation comprising measuring an inactive operating frequency of a first test circuit having a first plurality of elements connected by a first plurality of traces, measuring an inactive operating frequency of a second test circuit having a second plurality of elements connected by a second plurality of traces, measuring an inactive operating frequency of a third test circuit having a third plurality of elements connected by a third plurality of traces, and measuring an inactive operating frequency of a fourth test circuit having a fourth plurality of elements connected by a fourth plurality of traces, wherein the inactive operating frequencies of the first second, third, and fourth test circuits represent one or more effects of on-chin noise on signal propagation.
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