Method and structure for reducing noise in CMOS image sensors

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United States of America Patent

PATENT NO 7919827
APP PUB NO 20060202295A1
SERIAL NO

11077576

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method and device is disclosed for reducing noises in CMOS image sensors. An improved CMOS image sensor includes a light sensing structure surrounded by a support feature section. An active section of the light sensing structure is covered by no more than optically transparent materials. A light blocking portion includes a black light filter layer and an opaque layer covering the support feature section. The light blocking portion may also cover a peripheral portion of the light sensing structure. The method for forming the CMOS image sensors includes using film patterning and etching processes to selectively form the opaque layer where the light blocking portion is desired but not over the active section.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lin, Tsung-Yi Caotun Township, Nantou County, TW 43 291
Wu, Tien-Chi Yonghe, TW 9 52

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