Buried silicon dioxide / silicon nitride bi-layer insulators and methods of fabricating the same

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United States of America Patent

PATENT NO 7566630
APP PUB NO 20070166948A1
SERIAL NO

11335071

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Abstract

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Embodiments of the present invention relate to the fabrication of a buried bi-layer insulator of silicon oxide and silicon nitride in a microelectronic substrate, and to the buried silicon oxide/silicon nitride bi-layer insulator itself. The buried silicon oxide/silicon nitride bi-layer insulator may be formed by implanting oxygen ions and nitrogen ions into the silicon-containing microelectronic substrate and then annealing the silicon-containing microelectronic substrate to form silicon oxide and silicon nitride layers therein.

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Patent Owner(s)

  • INTEL CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Vo, Chanh Q Folsom, US 1 5

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