Contact plug and method of formation

Number of patents in Portfolio can not be more than 2000

United States of America

PATENT NO 11309217
APP PUB NO 20190273024A1
SERIAL NO

15909682

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Abstract

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A method of making a semiconductor device that includes forming a dielectric stack over a substrate and patterning a contact region in the dielectric stack, the contact region having side portions and a bottom portion that exposes the substrate. The method also includes forming a dielectric barrier layer in the contact region to cover the side portions and forming a conductive blocking layer to cover the dielectric barrier layer, the dielectric stack, and the bottom portion of the contact region. The method can include forming a conductive layer over the conductive blocking layer and forming a conductive barrier layer over the conductive layer. The method can further include forming a silicide region in the substrate beneath the conductive layer.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Chih-Wei Hsinchu, TW 342 1158
Chu, Li-Wei Hsinchu, TW 83 283
Huang, Hung-Yi Hsinchu, TW 68 606
Li, Ya-Huei Hsinchu, TW 7 12
Liao, Yu-Hsiang Hsinchu, TW 17 39
Su, Ching-Hwanq Hsinchu, TW 74 335

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