Probe for scanning over a substrate and a data storage device
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United States of America Patent
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Dec 7, 2010
Grant Date -
Jan 1, 2009
app pub date -
Aug 7, 2008
filing date -
Jan 13, 2005
priority date (Note) -
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status (Latency Note)
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Abstract
A method of scanning over a substrate includes implementing a write mode of the substrate by scanning a probe across a substrate, the probe having a spring cantilever probe mechanically fixed to a probe holding structure, a tip with a nanoscale apex, and an actuator for lateral positioning of the tip; the actuator comprising a thermally switchable element and a heating element for heating the thermally switchable element; and heating the heating element to a given temperature so as to locally soften a portion of the substrate and applying a force to the softened portion of the substrate through the tip so as to create one or more indentation marks in the softened portion of the substrate.
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