High precision single edge capture and delay measurement circuit

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United States of America Patent

PATENT NO 8736338
APP PUB NO 20130271196A1
SERIAL NO

13444195

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Abstract

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A method and circuit for providing on-chip measurement of the delay between two signals includes first and second delay chains (241, 242) having different delay values connected to sampling latches (222-227) which each include a data input coupled between adjacent delay elements of the first delay chain and a clock input coupled between adjacent delay elements of the second delay chain, thereby capturing a high precision delay measurement for the signals.

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Patent Owner(s)

  • NXP USA, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Burch, Kenneth R Austin, US 34 846
Cao, Lipeng Austin, US 23 203
Enriquez, Ramon V Round Rock, US 1 10
Pyron, Carol G Austin, US 1 10

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