Probe of detector for testing pins of electronic component
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United States of America Patent
Stats
-
Jul 27, 2010
Grant Date -
Dec 31, 2009
app pub date -
Sep 1, 2008
filing date -
Jun 27, 2008
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A probe of a detector includes a shield, an anode member, and a cathode member. The shield includes a top wall and a plurality of sidewalls extending down from the sides of the top wall. A first through hole and a second through hole are defined in the top wall. The anode member includes a first mounting portion, a first pin, and a first connecting portion connected between the first mounting portion and the first pin. The cathode member includes a second mounting portion, a second pin, and a second connecting portion connected between the second mounting portion and the second pin. The first and second mounting portions are respectively rotating within the first and second through holes to adjust corresponding ends of the first and second pins to come in contact with the electronic component.
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